The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1992
Filed:
Mar. 27, 1991
Jerold B Lisson, Henrietta, NY (US);
Darryl I Mounts, Pittsford, NY (US);
Dale K Mack, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for assessing the optical quality of an imaging device. The method is suitable for use in an optical system comprising a source of radiation that can output a radiation beam; and, an imaging device to be tested, which imaging device can image the radiation beam to produce an imaged beam. The steps of the method comprise: sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask; and, computing an optical transfer function (OTF) for the localized wavefront errors transmitted through the sampling apertures. The method has an advantage of expanding the applicability of the optical transfer function, heretofore a measure only of global imaging device performance, so that it can provide information for correcting an imaging device defect in terms of local area modifications.