The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1992

Filed:

Jan. 24, 1991
Applicant:
Inventor:

Masami Watanabe, Amagasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356372 ; 25022721 ; 2502311 ;
Abstract

An optical measuring apparatus for measuring physical quantity which has a frequency by applying an optical sensor which modulates intensity of the light according to the physical quantity, wherein malfunctions in the apparatus itself, concretely, in a condenser, an AC amplifier and a divider as well as in an optical transmitter, an optical fiber, an optical sensor, an optical receiver and a DC amplifier can be self-checked by superimposing an AC of a frequency higher than the frequency of the physical quantity on a driving current of the optical transmitter and monitoring the components of a signal of a frequency higher than a frequency of the physical quantity.


Find Patent Forward Citations

Watanabe, Masami. (1992). Optical measurement device (U.S. Patent No. 5125744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5125744

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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