The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 1992

Filed:

Jun. 20, 1990
Applicant:
Inventors:

Takashi Shibaguchi, Yokohama, JP;

Hiroyoshi Funato, Chigasaki, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02F / ;
U.S. Cl.
CPC ...
359319 ;
Abstract

An optical scanning apparatus for scanning a beam of light from a light source over a target surface by a scanning mechanism to form an image on the target surface. The optical scanning apparatus includes an electro-optic lens provided in an optical path between the light source and the scanning mechanism, a plurality of electrodes being provided on top and bottom surfaces of the electro-optic lens for producing an electric field in a direction perpendicular to the direction of the optical path, and a voltage applying unit being connected to the electrodes. The electro-optic lens is made from an electro-optic medium, and has an ingress surface and and egress surface which are ground to exhibit an adequate electro-optic effect. The beam is cast on the target surface to produce a dot having an enlarged diameter in the vertical scanning direction and in the horizontal scanning direction due to the electro-optic effect of the electro-optic medium when the electric field is produced within the electro-optic lens.


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