The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 1992

Filed:

Sep. 28, 1990
Applicant:
Inventors:

Fathy F Yassa, Clifton Park, NY (US);

Kenneth B Welles, II, Scotia, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
328155 ; 328 55 ; 307262 ; 307602 ; 307603 ; 307511 ;
Abstract

Apparatus for measuring or compensating for phase or time delay between a reference signal and a desired signal produces an approximate error signal by differentially summing the desired and reference signals. The appoximate error signal is then used, in a feedback loop, to control application of an adaptive delay to each of the reference and desired signals. The total lead or lag difference is represented by the difference between the two delays applied to the reference and desired signals, respectively. The phase or time delay measurement or compensation arrangements may be applied to linear variable differential transformers, synchronous AM detectors, zero crossing detectors and phase locked loops. Variations on this basic technique can yield substantially exact measurement or compensation. The invention is applicable to sampling arrangements including oversampling/decimation or interpolation/decimation to increase compensation accuracy to any desired degree.


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