The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 1992
Filed:
May. 29, 1991
Francois Baechler, Wermatswil, CH;
Zellweger Uster AG, Uster, CH;
Abstract
A sliver measuring device includes a pair of rollers (6, 7) which limit two sides of a rectangular measuring space (3). A third side of the measuring space (3) is closed off by a guide roller (8) or by a guide plate. A measuring element (5) for the thickness or non-uniformity of the sliver is arranged on a fourth side of the measuring space. The rollers (6, 7) serve to compact the sliver in the measuring space. The measuring element (5) is formed by a leaf spring provided with strain gauges. Since the sliver is actively driven at the measuring point, this leads to an increase in the compaction of the sliver and thus to an increase in the measuring accuracy dependent upon the compaction. On the other hand, the inertia of the measuring element is very low.