The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 1992

Filed:

Oct. 16, 1991
Applicant:
Inventors:

I-Wei Chen, Ann Arbor, MI (US);

Chinmau J Hwang, Midland, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C04B / ;
U.S. Cl.
CPC ...
264 60 ; 264 65 ; 264325 ; 264332 ;
Abstract

A method for deforming a ceramic compound by doping a zirconia ceramic material with an effective amount of a transition metal and superplastically deforming the material.


Find Patent Forward Citations

Chen, I-Wei. (1992). Method of superplastically deforming zirconia materials (U.S. Patent No. 5122317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5122317

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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