The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1992

Filed:

Jul. 25, 1990
Applicant:
Inventors:

Daniel A Clayton, Bellevue, WA (US);

Gregory M Garriss, Federal Way, WA (US);

Joe R Long, Auburn, WA (US);

Assignee:

The Boeing Company, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250560 ; 250561 ;
Abstract

A method and apparatus for monitoring characteristics of strips that are laid on a surface are disclosed. The method determines gaps and overlaps between adjacent strips on a surface by determining and analyzing the centerline skew and/or width of the strips near a common point of the surface. The method can be carried out during the strip lay-up process. The apparatus includes a sensor component and a controller. The sensor is positionable in close proximity to the point at which a strip is laid on a surface. Further, the sensor can be positioned on one side of the surface. The controller is in signal communication with said sensor component. The controller includes means for causing the sensor component to gather and transmit edge image signals. The controller receives the edge image signals and determines characteristics of the strip, such as centerline skew and width, as the strip appears on the surface. The characteristic information is analyzed to identify gaps or overlaps between adjacent strips.


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