The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1992
Filed:
Nov. 17, 1988
Yoshihiko Sano, Kyoto, JP;
Shigeru Makita, Kyoto, JP;
Maury Zivitz, Indianapolis, IN (US);
George H Sierra, Indianapolis, IN (US);
Omron Tateisi Electronics Co., Kyoto, JP;
Boehringer Mannheim Corporation, Indianapolis, IN (US);
Abstract
A reflection plate for a biochemical measuring instrument which is adapted to evaluate a biochemical value by obtaining a reflective property of a reflection surface of the reference reflection plate, obtaining a reflective property of test paper impregnated with biochemical sample and mounted on a test stick, and comparing the two reflective properties, wherein: the reflection surface of the reference reflection plate is depressed from the periphery thereof. Thereby, even though the test stick is required to be placed adjacent to the reflection surface to achieve a uniformity the optical arrangement in obtaining the two reflective properties, the contamination of the reflection surface from the sample can be prevented. Preferably, the reference reflection plate itself may be provided with a depression to defined the reflection surface at the bottom of this depression.