The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1992

Filed:

Jan. 25, 1991
Applicant:
Inventors:

Ikuo Osawa, Kyoto, JP;

Haruo Nakagawa, Kyoto, JP;

Hirofumi Kohno, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 22 ; 382 27 ; 382 44 ;
Abstract

A partial image section is set as including part of a contour line of a particular image area in an original image appearing on a display screen. An image in the partial image section is binarized by referring to a selected threshold level. A boundary of the resulting binary image is detected for extraction of contour data in the partial image section. A plurality of such partial image sections are set successively in a way to partly overlap each other. Contour data (N2,M2) in an overlapping region of two adjacent partial image sections (Ni,Ni-1) are extracted by obtaining a plurality of dividing points (m.sub.0,n.sub.0,m.sub.1,n.sub.1, etc.) dividing, in corresponding proportions, two partial extracted contour lines lying in the overlapping region of adjacent partial image sections, distributing segments linking corresponding dividing points on the two parallel extracted contour lines in ratios corresponding to an order of arrangement of the dividing points, and deriving contour data for the overlapping region from coordinates of these distributing points (i.sub.1, i.sub.2, etc).


Find Patent Forward Citations

Osawa, Ikuo. (1992). Method of and apparatus for extracting image contour data (U.S. Patent No. 5119439). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5119439

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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