The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1992

Filed:

Apr. 24, 1990
Applicant:
Inventors:

Kenneth B Welles, II, Scotia, NY (US);

Richard I Hartley, Schenectady, NY (US);

Michael J Hartman, Clifton Park, NY (US);

Paul A Delano, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 225 ; 371 221 ;
Abstract

Built-in test circuitry, which is appropriate for monolithic integrated circuit chips that are to be connected in a plural-chip package, uses electronic token passing to select one of the test input ports in the circuitry to be tested for application of test input vectors. The built-in test circuitry also uses electronic token passing to select one of the test output ports in the circuitry to be tested from which test results are to be supplied. Methods for testing based on these token passing procedures are described.


Find Patent Forward Citations

Welles, II, Kenneth. (1992). Testing of integrated circuits including internal test circuitry and (U.S. Patent No. 5119378). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5119378

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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