The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1992

Filed:

Jun. 28, 1989
Applicant:
Inventors:

Yoshifumi Hara, Hirakata, JP;

Tutomu Sakurai, Ikoma, JP;

Saburo Kubota, Katano, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
359110 ; 359165 ;
Abstract

A fault examining apparatus is provided in a loop network system, in which a master station is connected sequentially with a plurality of follower stations in a loop transmission path to transfer digital optical signals denoting serial data information from the master station to the follower stations, from the follower stations to the follower stations or from the follower stations to the master station. The apparatus includes a device for detecting and storing a present value, a maximum value and a minimum value of a peak level value of received optical signals, and a display device for displaying the values.


Find Patent Forward Citations

Loading…