Method of measuring dielectric material constants and measuring device

Abstract

A method of measuring dielectric material constants, which includes steps of forming a dielectric resonator by providing a plurality of coupling terminals for input and output of signals, on a shield case, with a dielectric sample being disposed within the shield case, constituting an oscillation circuit together with the dielectric resonator by connecting a positive feed-back circuit including an amplification circuit, between the signal output coupling means and the signal output coupling means, and measuring variation in an oscillation frequency of the oscillation circuit by heating the dielectric sample through injection of a high frequency power into the particular coupling terminal, so as to obtain a specific material constant of the dielectric sample based on the variation of the oscillation frequency, and, also a measuring device employed for effecting the measuring method.