The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1992
Filed:
Feb. 15, 1991
Paul R Haaker, Hamburg, DE;
Erhard P Klotz, Halstenbek, DE;
Reiner H Koppe, Hamburg, DE;
Rolf E Linde, Haseldorf, DE;
U. S. Philips Corporation, New York, NY (US);
Abstract
An X-ray diagnostic apparatus, comprises an X-ray source (1), an imaging surface (6) on which the intensity distribution of the X-rays to be applied to a test object (4) is imaged, an optical imaging device for imaging an overall image (10) of the imaging surface (6) onto the entrance surface of a first image sensor (11), a device (12) for the visual display of the overall image (10), and an imaging enlargement device for the enlarged visual display of a selectable detail of the overall image. Strongly enlarged and still high-resolution detail images are generated in that the selectable detail (20) of the overall image is directed onto a second image sensor 16) which discriminates a substantially higher number of pixels relative to the unit of surface area of the overall image.