The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 1992

Filed:

Apr. 18, 1990
Applicant:
Inventors:

Haruhisa Watanabe, Tokyo, JP;

Satoshi Tanaka, Tokyo, JP;

Shinya Matsuyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
436165 ; 356 39 ; 358 93 ; 36441307 ; 36441308 ; 436 63 ; 436520 ; 436534 ;
Abstract

A method for detecting and measuring the image of an agglutination particle pattern produced in a test liquid in which the existence of hemolysis in a test liquid is judged at the same time as an analysis is conducted of particle patterns produced in the test liquid in response to an immunological agglutination reaction. By this method, it is possible to increase the precision of the analysis of the particle pattern by feeding back the result of the judgement of the existence of hemolysis in the test liquid. A reaction apparatus suitable for use in the method according to the invention is also disclosed. In this apparatus, a plurality of wells for containing the test liquid are formed, and a plurality of marks are formed in positions where the marks can be read through the test liquid by an optical system for detecting the particle patterns produced in the test liquid. Therefore, hemolysis existing in the test liquid can be objectively judged.


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