The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1992
Filed:
Jan. 07, 1991
Charles C Wang, Rancho Palos Verdes, CA (US);
Joe S Zhou, Monterey Park, CA (US);
Optodyne, Inc., Compton, CA (US);
Abstract
A Michelson-type self-aligning interferometer utilizes a laser to produce an output beam of light that is split into signal and reference beams. The signal beam is directed through a Bragg-cell, for heterodyne detection, and a beam expander, for facilitating target acquisition, toward a retroreflector located on a target body. The signal beam is thereby reflected back through the beam expander and Bragg-cell toward the resonance mirror of the laser, and is now shifted in frequency by 2.OMEGA.. The returning signal beam remains co-linear with the output beam since it returns over the same path and through the same optical elements, especially the laser resonance mirror. Thus, the interferometer can accommodate a significant amount of component misalignment without loss of operation. The signal beam, once reflected from the resonance mirror of the laser and partially reflected by the beam splitter, is co-linear with the reference beam. The signal beam and reference beam are directed into a detector to produce an electrical signal. A frequency divider and a phase demodulator extract the phase of the electrical signal through heterodyne detection, the phase being proportional to the position of the retroreflector and, hence, the target body.