The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1992
Filed:
Jan. 28, 1991
Applicant:
Inventors:
Wolfgang Knoll, Mainz, DE;
Harald Knobloch, Albig, DE;
Assignee:
BASF Aktiengesellschaft, Ludwigshafen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356301 ;
Abstract
The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination, and imaging said light on a detector using an imaging system.
Knoll, Wolfgang. (1992). Examination of physical properties of thin films (U.S. Patent No. 5116121). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5116121
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