The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1992
Filed:
Sep. 30, 1991
Applicant:
Inventors:
Yukitsugu Nakamura, Sagamihara, JP;
Yoshimasa Hamano, Yamato, JP;
Takashi Masuda, Kawasaki, JP;
Isao Matsumura, Yokosuka, JP;
Shigeo Maruyama, Machida, JP;
Kazunobu Kobayashi, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351205 ; 351211 ; 351214 ; 606-4 ;
Abstract
An ophthalmologic apparatus can measure the eye axis length of an eye to be examined and other information of the eye to be examined (for example, the cornea refractive power). In the case of the measurement of the eye axis length, when moving a detecting terminal itself by driving means, the driving means is controlled so as to slow down the speed of movement of the detecting terminal when the detecting terminal comes near the cornea of the eye to be examined.