The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1992
Filed:
Oct. 19, 1989
Applicant:
Inventors:
Thomas L Langford, II, Wichita, KS (US);
Philip W Bullinger, Wichita, KS (US);
Assignee:
NCR Corporation, Dayton, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
371 223 ; 371 251 ; 371 221 ;
Abstract
A boundary scan test circuit for inclusion into ASIC and or VLSI circuits which does not require any additional pads/pins to support full boundary scan functionality. The invention uses the power and capability of existing address and data buses to transfer test data into the integrated circuit under boundary scan test, and uses the same buses to transfer test results out of the integrated circuit under test to be interpreted by the test processor of the system.