The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1992
Filed:
Jul. 26, 1990
Applicant:
Inventor:
Mitsuhiro Hamada, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365200 ; 365201 ;
Abstract
In a test of a fabricated semiconductor memory chip, a test control signal is supplied to a test control circuit, so that a spare memory cell array is tested whether spare memory cells are functionable for writing and reading of data. The test control signal is applied to terminals which are used for the supplying of an address signal, etc. For this purpose, the test control signal has a level different from that of the address signal. Therefore, the spare memory cell array can be tested simultaneously with a test of normal memory cell array.