The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1992
Filed:
Mar. 19, 1991
Applicant:
Inventors:
Wei-chan Hsu, Plano, TX (US);
William R Krenik, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
307355 ; 307356 ; 307362 ; 307491 ;
Abstract
An amplifier includes an input circuit for alternately selecting input signals to be compared and a first bias circuit for producing self-bias when one of the input signals is selected. A second bias circuit stores the self-bias for use in the amplifier when the other of the input signals is selected for rejecting noise which may accompany power supply voltage applied to the amplifier.
Hsu, Wei-chan. (1992). Apparatus and method for comparing signals (U.S. Patent No. 5113091). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5113091
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile