The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1992
Filed:
Jul. 23, 1990
Theodore D Fay, Mission Viejo, CA (US);
William F Morgan, Long Beach, CA (US);
Stanley Schneider, Rancho Palos Verdes, CA (US);
McDonnell Douglas Corporation, Long Beach, CA (US);
Abstract
Optical apparatus for measuring angles to a precision approaching the theoretical optical limit for a fixed aperture. Calculations and measurement of the angle are made on the basis of the displacement of a very detailed waveform on a multi-pixel detector from a known point on the detector. The angle this displacement represents is created by the angular displacement of a dispersive element attached to the object of interest. The beamline comprises an optical source, the dispersive element on the object, and a spectrometer which contains an echelle and the detector. The known point on the detector is established by aligning the beamline to a fiducial angle.