The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 1992

Filed:

Apr. 23, 1991
Applicant:
Inventor:

James D Johnson, West Point, UT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
33559 ; 33561 ; 33556 ; 33503 ;
Abstract

The present invention is directed to a contact-type probe for obtaining positional information concerning a workpiece characteristic, simultaneously in more than one positional axis. The probe comprises a probe body for mounting in a machine tool and to which other components may be mounted, a double swivel joint mounted to the probe body and a probe shaft mounted to the swivel and carrying a workpiece contact on one end. In operation, the workpiece contact attached to the probe shaft is moved over the workpiece, and the contact engages a characteristic such as an aperture in the workpiece. The probe body remains in a defined position, while the probe shaft may swivel in two axes to engage the characteristic. The magnitude of displacement necessary for the probe shaft to engage the characteristic may be determined to provide positional information concerning the characteristic.


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