The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1992
Filed:
Nov. 21, 1989
Applicant:
Inventor:
Hidetada Fukunaka, Hadano, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 211 ; 371 225 ; 365201 ;
Abstract
Method and apparatus for testing a memory mounted on an information processing system which includes a processor and at least one memory device. The memory device has a built-in memory test capability. In testing the memory mounted on the system, a test using the built-in test capability is combined with an additional test using a normal write/read operation of the memory performed by the processor unit. While the test using the built-in test capability is performed over the entire memory addresses, the additional test is performed with limited addresses.