The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1992
Filed:
Mar. 05, 1991
John P Wikswo, Jr, Brentwood, TN (US);
Nestor G Sepulveda, Nashville, TN (US);
W Patrick Henry, Nashville, TN (US);
Duane Crum, San Diego, CA (US);
Vanderbilt University, Nashville, TN (US);
Abstract
Flaws in an electrically conductive sample object are detected by cancelling the magnetic field generated by a detection current passed through the sample object by passing the current back through an unflawed field cancelling object placed next to the sample object, and measuring the uncancelled field produced by any flaw, preferably with a superconducting quantum interference device (SQUID) magnetometer. Elongated objects such as tubes and rods are fed through a sleeve which forms the field cancelling object, with the current applied to the elongated member and passed to the field cancelling sleeve through sliding contacts.