The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1992
Filed:
Dec. 28, 1990
Akihiro Sugiyama, Tokyo, JP;
Kabushiki Kaisha Topcon, , JP;
Abstract
The present invention relates to a perimetric instrument for measuring a range of a visual field of an eye of a man, and more particularly to a perimetric instrument which includes an abnormal visual field pattern analogical inferring section using a multilayer neural network and can analogically infer an abnormal visual field pattern of a measurement object person. Further, the present invention provides a perimetric instrument which can automatically make a determination of an additional target. In particular, according to the present invention, a multilayer neural network including an input layer, hidden layers and an output layer introduces a neural weight ratio which is determined based on responses when the visual field is normal and abnormal, and as a response from a responding section is inputted to the input layer while an output from the output layer is sent out to an analogical inferring section, the analogical inferring section can analogically infer an abnormal visual field pattern of the measurement object person. Accordingly, it is possible to help judgment of an abnormal visual field pattern by a measurer, and since also labor, time and so forth of the measurer are reduced, burdens to the measurer and them easurement object person can be reduced remarkably.