The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1992
Filed:
Sep. 14, 1989
Toshio Hagihara, Owariasahi, JP;
Yoshihiko Uchikawa, Kasugai, JP;
Kenji Sato, Owariasahi, JP;
Akio Emoto, Owariasahi, JP;
Tomoyasu Kato, Seto, JP;
Hitach, Ltd., Tokyo, JP;
Hitachi Asahi Electronics Co., Ltd., Owariasahi, JP;
Abstract
A method successively test information processing devices, that include a main storage, a CPU, an external storage, etc., in a plurality of test steps in accordance with test programs along a test line composed of baths with different temperatures/humidities. A table and a pointer corresponding to the table are stored in an external storage and a non-volatile memory, respectively. A test program, test items and a test procedure are previously described for each test step in the table. The test object is shifted to a certain bath on the test line, and a prescribed test for the test object is performed at the timing of turning-on of the driving power therefor in accordance with the test procedure described in the procedure table corresponding to the pointer. The value of the pointer is updated each time the power is turned on. The test program is always updated referring to the pointer even when the test steps are successively advanced to repeat the on/off action of the power, thereby automatically performing a series of test steps.