The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1992
Filed:
May. 25, 1990
Hiromi Okada, Fujinomiya, JP;
Masuo Kabutomori, Fujinomiya, JP;
Hiroshi Ikeno, Hachioji, JP;
Tamio Saitou, Hachioji, JP;
Nireco Corporation, both of, JP;
Fuji Photo Film Co., Ltd., both of, JP;
Abstract
A method for detection of the edge and/or shape of transparent films, wherein the incident rays from a light source enter a polarizer to yield the linearly polarized light for irradiation to a transparent film with a property of rotatory polarization, and the rotatorily polarized light therefrom is transmitted through an analyzer with a polarization axis orthogonal to that of the polarizer, allowing the transmitted light to indicate the edge position and/or shape of the transparent film. An apparatus for detection of the edge and/or shape of transparent films, which is furnished with a polarizer, analyzer and detector to utilize the property of rotatory polarization of a transparent film placed between the polarizer and the analyzer, wherein the polarizer linearly polarizes the incident rays from a light source, emitting the light to be fed to the analyzer, a polarization axis of which is orthogonal to that of the polarizer, and the detector recognizes the output of the analyzer.