The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1992

Filed:

Apr. 17, 1991
Applicant:
Inventors:

Hiroshi Satoh, Hyogo, JP;

Yoshihiko Utsui, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ; G01B / ;
U.S. Cl.
CPC ...
7386236 ; 73779 ; 324209 ; 505842 ; 505872 ;
Abstract

In a strain measuring device employing a magnetic permeability detector means to detect an amount of strain in a passive member as changes of magnetic permeability in a magnetostrictive layer, a magnetic shielding layer is formed on the surface of the passive member, and the magnetostrictive layer is formed thereon so as to lessen the adverse effects of the passive member caused by the magnetic characteristics of the passive member in strain measurement, that is, to reduce measurement errors. Alternatively, a magnetostrictive layer is formed on the surface of the passive member, or a magnetic shielding layer is partially formed on the surface of the passive member of a soft magnetic material with high permeability, so as to lessen the influence of the passive member caused by thermal stresses of the passive member in strain measurement, that is, to reduce measurement errors. Further, there is provided a strain measuring device which facilitates formation of the magnetostrictive layer.


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