The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1992

Filed:

Mar. 18, 1991
Applicant:
Inventors:

Bradley J Stringer, Farmington, UT (US);

Brian H Smith, Kaysville, UT (US);

Robert L Kennington, Fruit Heights, UT (US);

Assignee:

Quantronix, Inc., Farmington, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
367 99 ; 364564 ;
Abstract

The present invention relates to methods and apparatus for measuring the linear dimensions and determining the three-dimensional, spatial volume of objects. In the preferred embodiments, ultrasonic sensing is employed, alone or in combination with other measuring methods such as light curtains and the timing of moving objects, to ascertain linear dimensions. The preferred embodiments are particularly adapted to the measurement of large and irregularly configured objects, such as palletized loads, and to the measurement of moving, rectangular objects of random orientation with respect to the direction of travel.


Find Patent Forward Citations

Stringer, Bradley. (1992). Measuring method and apparatus (U.S. Patent No. 5105392). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5105392

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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