The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1992
Filed:
Jan. 17, 1991
Gabriel V Garcia, Las Cruces, NM (US);
John B Walter, Ammon, ID (US);
Kenneth L Telschow, Idaho Falls, ID (US);
Abstract
A method of monitoring a material during processing comprising the steps of (a) shining a detection light on the surface of a material; (b) generating ultrasonic waves at the surface of the material to cause a change in frequency of the detection light; (c) detecting a change in the frequency of the detection light at the surface of the material; (d) detecting said ultrasonic waves at the surface point of detection of the material; (e) measuring a change in the time elapsed from generating the ultrasonic waves at the surface of the material and return to the surface point of detection of the material, to determine the transit time; and (f) comparing the transit time to predetermined values to determine properties such as, density and the elastic quality of the material.