The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1992
Filed:
Oct. 04, 1990
Kevin D Crowley, Oxford, OH (US);
Joel H Young, Norman, OK (US);
Other;
Abstract
Apparatus for positioning objects for microscopic examination includes a stage module which may be attached to standard microscope, and a control module. The stage module is comprised of a translating stage, a rotating stage, and a pair of rotating sample holders. The translating stage is movable horizontally in a linear direction, and the rotating stage is carried on the translating stage for rotational movement about a vertical axis. The rotating sample holders may be rotated about their centers, and they are linked together so that their rotational movements are equal in magnitude but opposite in direction. The respective movements of the translating stage, the rotating stage and the rotating sample holders are controlled by the control module. A method for microscopic examination of objects includes the step of moving the translating stage and rotating the sample holders to bring an original point on an object that is placed in one of the sample holders to a focal point of an objective lens of the microscope. The method further includes the step of rotatably moving the rotating stage 180 degrees about its axis of rotation to bring a complementary point on an object that is placed in the other sample holder to the focal point of the objective lens.