The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1992

Filed:

Sep. 17, 1990
Applicant:
Inventors:

Stanley P Turcheck, Jr, Homer City, PA (US);

Randy K Baird, Bolivar, PA (US);

James P Martin, Blairsville, PA (US);

Assignee:

FMC Corporation, Chicago, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358101 ; 358106 ;
Abstract

A high-resolution vision system for a detailed inspection of parts. A charge coupled device provides high-resolution in both an X and a Y axis. Data from the charge coupled device resulting from a standard part is stored in compact form. Compact data from a part being inspected is compared with the compact data from the standard part to determine if the tested part is good or not.


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