The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1992
Filed:
Aug. 24, 1990
Applicant:
Inventors:
Assignee:
Sharp Kabushiki Kaisha, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 371 221 ; 371 225 ;
Abstract
An integrated circuit device provided with test mode function has a plurality of terminals used for receiving and/or feeding out signals during a normal operation of the device. At least one terminal of the plurality of terminals are connected to a register for storing test mode setting data applied through the at least one terminal during a reset cycle period of the device. In accordance with the test mode setting data stored in the register, a setting of a predetermined test mode of the device is executed.
Quick Actions:
Okano, Nobuhiro. (1992). Integrated circuit device provided with test mode function (U.S. Patent No. 5103167). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5103167
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