The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1992

Filed:

Sep. 04, 1990
Applicant:
Inventors:

Tetsuhiko Takahashi, Tokyo, JP;

Manabu Nakagawa, Kanagawa, JP;

Toshihiko Shimizu, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ; G01D / ;
U.S. Cl.
CPC ...
2502521 ; 25636309 ; 25637001 ;
Abstract

A method of and apparatus for radiation detection including temperature control so that the temperature of the radiation detector, which includes a photodiode with a leakage current of 0.4-18 pA, is controlled to a setup temperature plus or minus 0.35.degree. C. With this condition established, offset data and reference data of the detector are collected in the absence of a body under test, offset data immediately before an actual signal measurement is collected and thereafter signal data through the exposure of a body under test is collected. The collected data are subjected to sensitivity calibration and offset calibration, thereby to obtain projection data, and image data is obtained through image processing of the projection data.


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Takahashi, Tetsuhiko. (1992). Method and apparatus for detecting x-ray radiation (U.S. Patent No. 5103092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5103092

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