The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1992

Filed:

Dec. 18, 1989
Applicant:
Inventors:

Michael K Cueman, Niskayuna, NY (US);

Frederick C Schoenig, Jr, Wilmington, NC (US);

Kurt D Ellis, Wilmington, NC (US);

James D Landry, Wilmington, NC (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
364550 ; 324238 ; 324237 ; 324240 ; 340680 ; 364552 ; 364472 ; 73622 ; 29705 ; 72-9 ; 266 99 ;
Abstract

A method for operating a computer to control the manufacture process of zirconium tubes in a pilger mill operation, the computer including an electronic memory and being coupled to the pilger mill to receive, as input, data related to the operation of the mill. The method comprising, in one embodiment, the steps of storing in the computer memory respective test signals, each test signal corresponding to a signal obtained by inspecting a tube manufactured by the mill with a respective, known defective operation condition, inspecting a zirconium tube finished by the manufacture process and generating a signal representative of the physical dimensions and material configuration of the tube, comparing the generated representative signal of the zirconium tube with the stored test signals, alerting an operator if the generated representative signal of the zirconium tube correlates to a stored test signal, and identifying the defective operation condition which corresponds to the correlated stored test signal.


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