The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 1992
Filed:
Mar. 08, 1990
Mitsunobu Nagashima, Katsuta, JP;
Ryuzaburo Takeda, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Instrument Eng. Co., Ibaraki, JP;
Abstract
When the center of an object of interest imaged and the center of a display screen or image area deviate from each other, a Fourier transformation imaging method includes (a) a step of representing the amount of deviation of those centers from each other by the amount of deviation in a frequency encoding direction and the amount of deviation in a phase encoding direction, (b) a step of converting each of the amounts of deviation in the frequency and phase encoding directions into a value calculated in terms of the amount of rotation of the phase angle of a measured resonance signal, (c) a step of correcting the amount of rotation of the phase angle of the measured resonance signal on the basis of the values obtained by the conversion, and (d) a step of Fourier-transforming the corrected signal to display an image in which there is no deviation or the center of the object of interest is located at the center of the image area.