The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1992

Filed:

Aug. 10, 1990
Applicant:
Inventor:

Masaki Sawamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2502 / ; 250225 ;
Abstract

A method of detecting an opaque foreign article from among transparent bodies which assures a distinct difference between detection signals originating from a transparent body and an opaque foreign article and a high S/N ratio in such detection signals and is improved in accuracy in detecting operation. The method comprises the steps of scanning, while an object for the detection which may be one of transparent bodies or an opaque foreign article existing in such transparent bodies is being moved, the object for the detection by a beam of linearly polarized light, and detecting reflected light from the object for the detection upon each scanning using an optical sensor such as a charge coupled device camera by way of a polarizing filter.


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