The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1992

Filed:

Mar. 13, 1990
Applicant:
Inventors:

Tomonori Mimura, Katsuta, JP;

Takehide Satou, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 67 ; 422 8209 ; 436 50 ; 436 55 ; 356 73 ; 364497 ;
Abstract

An automatic analyzing apparatus and method transfers a sample to be examined to a sampling position, fractionally injects the sample into a reaction vessel by using sampling means, adds a reagent to the reaction vessel holding therein the sample fractionally injected to cause reaction, and measures absorbance of the reaction solution at predetermined time intervals using a photometer. A first check for checking whether an abnormality is present in the measurement result of each measurement item is made, followed by a second check for checking whether an abnormality is present on the basis of a change in the rate of absorbance measured after the reagent is added to the sample in the reaction vessel. Then, a third check computes correlation of measured absorbance data and checks whether an abnormality is present on the basis of the result of computation. Finally, a determination is made, with respect to the sample in accordance with an abnormal item when it is judged that an abnormality is present in the result of the first, second or third check, whether remeasurement is necessary, and for selecting, in case of remeasurement, either remeasurement under the same conditions or remeasurement with a reduced sample quantity as compared with that of the first measurement conditions. When remeasurement is determined, the sample is carried to the sampling position.


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