The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1992
Filed:
Feb. 12, 1991
Walter Hillen, Aachen, DE;
Ulrich Schiebel, Aachen, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
A plurality of electrometer probes scan the charge pattern of a photoconductor (1), the distance between the electrometer probes (6) and the photoconductor (1) being measured via an alternating voltage applied to the photoconductor (1). The alternating voltage is scanned by the electrometer probes and is filtered out to extract distance measuring signals. The output signals of all electrometer probes (6) are used for determining image values of the X-ray image, the output signals of at least some of the electrometer probes (6) also being used, via a suitable filter (23), for determining the distance measuring signals. An adjusting device adjusts the distance between the electrometer probes (6) and the photoconductor (1) continuously to a reference value, in dependence on the value of the measuring signals, during the scanning operation.