The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1992
Filed:
Oct. 09, 1990
Henry M Dimmick, Sr, Butler, PA (US);
William L Layton, Butler, PA (US);
Lloyd B Stivison, West Sunbury, PA (US);
Mark F Zanella, Sr, Zelienople, PA (US);
AGR International, Inc., Butler, PA (US);
Abstract
Apparatus for inspecting the thickness of a container wall, such as a glass or plastic container wall including a plurality of elongated sensors disposed in a linear array in spaced end to end relationship. The containers are urged into intimate contact with the sensor elements and are rotated thereover. The containers are moved from sensing element to sensing element with each element inspecting a portion of the circumference. Oscillators convert the change in capacitance to a corresponding voltage which, in turn, in a processor is converted to an actual thickness reading which is compared with desired predetermined thickness levels. By segmenting the sensors in this manner, a plurality of containers may be inspected simultaneously with a processor combining the individual segments of sensor readings so as to reconstruct the complete thickness evaluation of the container. A corresponding method is provided.