The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1992
Filed:
Apr. 09, 1990
Hermann-Josef Eul, Essen, DE;
Burkhard Schiek, Bochum, DE;
Laboratorium Prof. Dr. Rudolf Berthold GmbH & Co., Wildbad, DE;
Abstract
Methods for establishing the complex measuring capability of homodyne operating network analyzers. Single port as well as two-port measuring devices are treated in which the signal detection takes place by means of a linear mixing process. It is possible to overcome the disadvantage of the homodyne detection process, which does not directly supply information relating to the amplitude and phase of the measurement signal, by measuring arbitrary unknown standards. The required number of different unknown standards depends, among other things, on the complexity of the measuring device used. One of the proposed methods operates without any standards at all. After weighting factors have been determined, complex measuring values can be ascertained and one can then proceed as in the case of a heterodyne network analyzer, i.e. with system error calibration measurements and finally with DUT (device under test) measurements.