The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 1992

Filed:

Aug. 13, 1991
Applicant:
Inventors:

Walter W Hildenbrand, Brewster, NY (US);

Steven G Utterback, Peekskill, NY (US);

Assignee:

IBM Corporation, Armonk, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250310 ; 250305 ; 250397 ;
Abstract

An inspection system employing high collection efficiency energy filtered backscatter electrons. At least two detectors are positioned relative to the sample at spaced locations. Each detector has a canister with a fiberoptic bundle mounted therein. A scintillator detector is mounted at the end of the fiberoptic bundle. A ground grid is mounted at an opening of the canister in axial alignment with the scintillator detector. An energy filter is interposed between the scintillator detector and the ground grid. The energy filter is an electrostatic retarding potential grid to permit detection of only high energy backscatter electrons. The geometry of the detectors relative to the specimen together with the conical shape of the detector housing achieves maximum collection efficiency of the targeted electrons.


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