The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1992
Filed:
Oct. 17, 1990
Masao Takatoo, Katsuta, JP;
Chieko Onuma, Ibaraki, JP;
Junzo Kawakami, Mito, JP;
Masayuki Fukai, Hitachi, JP;
Tadaaki Kitamura, Hitachi, JP;
Seiitsu Nigawara, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An abnormality monitoring system comprises controller for changing monitoring frequency according to the operating state of devices to be monitored and the degree of monitoring importance and controller for correcting an inputted monitor picture by computing a positional shift of the monitor picture to a reference picture using a mark position of the monitor picture and a mark position of the reference picture, wherein, when abnormality is detected, the contents of the abnormality and the contents of processing against the abnormality are displayed as a guidance.