The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 1992

Filed:

Feb. 21, 1991
Applicant:
Inventors:

Shigetomo Sawada, Isehara, JP;

Kazuo Kobayashi, Ayase, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356338 ; 359860 ; 359863 ;
Abstract

An optoelectrical particle detection apparatus comprising concave and convex reflectors spaced from each other by a predetermined distance, a laser source for emitting a laser beam and introducing the laser beam between the concave and convex reflectors, the concave and convex reflectors and the laser source being arranged so that the laser beam is multi-reflected at a much closer pitch to form a laser beam curtain in which the multi-reflected beam segments are overlapped with respect to each other to enhance a light intensity thereof, and an optoelectrical detector for receiving light scattered due to a presence of particles in the laser beam curtain, whereby the presence of particles can be detected in the laser beam curtain with a high probability and a high sensitivity.


Find Patent Forward Citations

Sawada, Shigetomo. (1992). Optoelectrical particle detection apparatus (U.S. Patent No. 5094533). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5094533

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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