The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1992

Filed:

Jan. 09, 1991
Applicant:
Inventor:

James E Milan, Buxton, ME (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01R / ;
U.S. Cl.
CPC ...
439 66 ; 3241 / ; 439378 ; 439482 ;
Abstract

An electrical connector (10) provides a mechanical coupling and an electrical interface between circuit boards (12,14). An elastomeric electrical conductor (20) provides compressible electrical connector paths between first and second sets of electrical contact pads (28,15) coupled to the respective circuit boards. A compression mounting assembly (22) aligns and retains the elastomeric electrical conductor (20) between the sets of electrical contact pads. The elastomeric electrical conductor (20) affords relatively high frequency signal conducting paths with substantially constant impedance for example for passing test signals and pin signals without distortion between circuit boards in the test head of an IC device tester. A mechanical spring system (64,65) spring loads the compression mounting assembly (22) and provides a relatively high mechanical compliance coupling between circuit boards (12,14) to accommodate relative change of position of the boards due to misalignment or board warpage. The electrical connector (10) is used for example between the pin electronics cards (12) and the IC device under test loadboard (14) in the test head of IC device testers for testing high speed ECL devices.


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