The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1992
Filed:
Jun. 27, 1990
Russell D Young, Pasadena, MD (US);
Other;
Abstract
A precision small scale force sensor utilizing a strain gauge for measurement of foces associated with small scale surface typography, minor pressure variations or other force phenomenon. A sensor or probe is connected to a thin filament of electrically conductive material whose electrical properties vary proportionate to changes in the physical dimensions of the filament. In surface topography applications, the sensor or probe is brought into close proximity with the surface to be measured, in non-contact interaction with the surface. The resultant attractive and/or repulsive forces between the probe and the surface produce deformation of the strain gauge material. Deformation of the strain gauge material results in a change in its electrical properties. The changes are monitored to determine the extent of interactive forces between the probe and the surface. By measuring the changes in the interactive forces as the probe is scanned parallel to the surface, a surface typography can be plotted. In other applications, the force is exerted on the probe which is displaced as a result. The resultant displacement is transferred to the strain filament whose resultant electrical variations are monitored.