The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 1992

Filed:

Dec. 27, 1989
Applicant:
Inventors:

Manfred Pauli, Mannheim, DE;

Rudolf Schussler, Mannheim, DE;

Assignee:

Boehringer Mannheim GmbH, Mannheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 63 ; 422 681 ; 422 8205 ; 356244 ;
Abstract

Test carrier analysis system consisting of test carriers and an associated evaluation apparatus. The evaluation apparatus has a positioning device (5) for the exact positioning of a test carrier (1). A fixing element engaging with a recess (8) of the test carrier (1) is used for this purpose. Improved handling properties with lowest possible design outlay and good positional accuracy are achieved by the fact that the positioning device (5) comprises a stop (17) for the introduction end (1a) of the test carrier (1), the test carrier rest (6) supports the test carrier (1) at least in the vicinity of the recess (8) in a level plane, the fixing element (9) comprises a bit stop (9b) limiting its depth of penetration into the recess (8) and the actuating organ (10) of the fixing element (9) is so designed and disposed that in the measurement position a force is exerted on the test carrier (1) which has both a component parallel to the surface of the latter in direction onto the stop (17) and a component normal to its surface in direction onto the test carrier rest (6).


Find Patent Forward Citations

Loading…