The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 1992
Filed:
Nov. 13, 1989
Muneharu Ishikawa, Ryuugasaki, JP;
Ayafumi Taniji, Tsukuba, JP;
Kowa Company Ltd., , JP;
Abstract
A particle measurement apparatus is disclosed in which a laser beam is projected at a sample containing particles to be measured in a measurement zone and light scattered by particles in the sample is evaluated to thereby determine properties of particles in the sample. The apparatus includes a plurality of light receiving systems for receiving scattered light arranged at different angles relative to the axis of the laser beam. The amplitude of scattered light signals from the light receiving systems are compared with predetermined values. The arrangement is such that particles are counted by size only when the scattered light signals from the light receiving systems exceed a predetermined value, enabling false signals caused by noise and the like to be eliminated and assuring more accurate measurements.