The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1992
Filed:
Aug. 21, 1989
Masahiro Shiokawa, Kanagawa, JP;
Makoto Ikeda, Kanagawa, JP;
Kiyoshi Sohma, Kanagawa, JP;
Masami Iriki, Koufu, JP;
Kinji Uchino, Yokohama, JP;
Yoshikatsu Kawashima, Yokosuka, JP;
Masahiro Kusakabe, Yokohama, JP;
Terumo Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided are a temperature measuring probe separable from a main body which includes a signal processor, and an electronic clinical thermometer equipped with this probe. The temperature measuring probe includes a temperature measuring circuit supported by a flat, flexible, strip-shaped base member, in which the temperature measuring circuit is sealed by a coating member, such as a film, and/or a filler, one end thereof being treated to form a connector. This structure allows the overall probe to be formed into a film-, sheet- or plate-like configuration. Preferably, a core member is provided between the base member and coating member, with the flexiblity and rigidity of the overall probe being decided by selecting the thickness, material and cross-sectional configuration of the core. The temperature measuring circuit preferably is composed of the minimum number of required circuit elements, and individual probes are provided with interchangeability by trimming, selection of characteristics or other treatment.