The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 1992

Filed:

Sep. 29, 1989
Applicant:
Inventors:

Stanley B Smith, Jr, Punta Gorda, FL (US);

Robert G Schleicher, Winchester, MA (US);

Assignee:

Thermo Jarrell Ash Corporation, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ; G01J / ;
U.S. Cl.
CPC ...
356328 ; 356305 ; 356334 ;
Abstract

A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; collimating structure in the first path for providing collimated radiation along a second path; fixed refraction structure in the second path for spatially separating (refracting) radiation in the second path in a first direction as a function of wavelength; fixed echelle grating structure in the second path for spatially separating the refracted radiation as a function of wavelength in a second direction orthogonal to the first direction and directing the orthogonally dispersed radiation in a beam along a third path that does not pass through the first refraction structure; and two-dimensional array detector structure for detecting the beam of orthogonally refracted radiation.


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